Fused silica powder is produced by melting natural quartz to form amorphous quartz, followed by purification, ultrafine grinding, precision classification and surface treatment processes.
It boasts high purity, excellent thermal stability and superior weather resistance, coupled coefficient of thermal expansion and full-range particle size distribution. With low dielectric constant and low dielectric loss, it is applicable to electronic materials of grade M6 and below.
Good thermal expansion property with stable-size, free of crackig under alternating high and low temperature environments.
Fused silica powder is produced by melting natural quartz to form amorphous quartz, followed by purification, ultrafine grinding, precision classification and surface treatment processes.
It boasts high purity, excellent thermal stability and superior weather resistance, coupled coefficient of thermal expansion and full-range particle size distribution. With low dielectric constant and low dielectric loss, it is applicable to electronic materials of grade M6 and below.
Good thermal expansion property with stable-size, free of crackig under alternating high and low temperature environments.
Typical data
|
Test items |
Unit |
LF003 |
LF10 |
Test method |
|
|
Composition |
SiO2 |
% |
99.5 |
XRF |
|
|
Particle size |
D50 |
μm |
0.8 |
2.9 |
Particle size Analyzer |
|
D99 |
μm |
1.7 |
7.6 |
||
|
CTE |
ppm/℃ |
0.4 |
Theoretical Value |
||
|
EC |
us/cm |
≤10 |
EC Analyzer |
||
|
pH |
—— |
6.5±1.0 |
pH Analyzer |
||
|
Mohs hardness |
—— |
6 |
Theoretical Value |
||
Typical data
|
Test items |
Unit |
LF003 |
LF10 |
Test method |
|
|
Composition |
SiO2 |
% |
99.5 |
XRF |
|
|
Particle size |
D50 |
μm |
0.8 |
2.9 |
Particle size Analyzer |
|
D99 |
μm |
1.7 |
7.6 |
||
|
CTE |
ppm/℃ |
0.4 |
Theoretical Value |
||
|
EC |
us/cm |
≤10 |
EC Analyzer |
||
|
pH |
—— |
6.5±1.0 |
pH Analyzer |
||
|
Mohs hardness |
—— |
6 |
Theoretical Value |
||